Radiant EMMI/Thermal/Laser Scanning.

Sift-InGaAs with Prostation Image
Sift-InGaAs with Prostation Image

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection, Thermal hot spot detection and Laser scanning system.

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Sift-InGaAs with Prostation Image
Sift-InGaAs with Prostation Image

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection, Thermal hot spot detection and Laser scanning system.

press to zoom
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Radiant Optronics specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection, Thermal hot spot detection and Laser scanning system.

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