EMMI/Thermal/Laser Scanning.

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection, Thermal hot spot detection and Laser scanning system.

01

Front Side/ Backside Photon Emission copy

 

EIR CCD Camera​

InGaAs Camera

02

03

Time of Flight SIFT

04

05

Moire

 

Thermal Imaging

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Sift-InGaAs with Prostation Image

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection, Thermal hot spot detection and Laser scanning system.